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Evaluating Measurement Accuracy: A Practical Approach (Paperback)

Evaluating Measurement Accuracy: A Practical Approach By Semyon G. Rabinovich Cover Image
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Description


Provides new methods for calculating uncertainty of multiple indirect measurementsDescribes a simple method for estimating the systematic error in multiple measurements
Presents a universal method for summation of systematic and random errors of measurement
New edition includes methods for calculating inaccuracy of single measurements most widely used in practice, but largely neglected in traditional theory
Now provides a step-by-step guide on how to evaluate measurement accuracy
Serves as a short convenient reference for scientists in any field

About the Author


The first 16 years of Dr. Semyon Rabinovich's career were spent in industry, where he created a number of electrical measuring instruments, including those that were mass-produced, as well as unique direct-voltage measuring instruments reaching the theoretical sensitivity limits. Following this, Dr. Rabinovich organized the Laboratory of Theoretical Metrology at the All-Union State Research Institute of Metrology (VNIIM) in the former USSR and was the head of this lab for the next 16 years. After a period in the aftermath of his decision to emigrate from the USSR when any reference to his name was a taboo, VNIIM now lists Dr. Rabinovich among their "renown scientists" in the theoretical metrology area. After moving to the USA, he took part in the work of two ISA Subcommittees in preparing ISA-RP67.04 "Setpoints for Nuclear Safety-Related Instrumentation" and "Methodologies for the Determination of Setpoints in Nuclear Safety-Related Instrumentation." He has published six books and more than 100 other publications including 21 patents. Previously this book was published by American Institute of Physics.


Product Details
ISBN: 9783319867854
ISBN-10: 3319867857
Publisher: Springer
Publication Date: May 17th, 2018
Pages: 323
Language: English
Series: Springer Series in Measurement Science and Technology
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Data Source: Ingram
Created At: 8/26/2018 12:43am
Last Updated At: 5/10/2022 10:22am